New XUV and Soft X-ray camera models of sCMOS cameras

Wednesday, 28 September 2022 00:00 Last Updated on Friday, 12 May 2023 09:00 Written by Administrator

xij scmos gsense400 bsi pulsar cooled camera xuv soft x-ray

XIMEA releases sCMOS Scientific grade camera models with Gpixel GSENSE400 BSI Pulsar

Muenster, Germany, MAY 2023 – As part of its xiLAB initiative, XIMEA expands the xiJ family of cooled sCMOS cameras with models for XUV and Soft X-ray imaging.

For a long time, the diffraction limit defined by Ernst Abbe defined the natural barrier that restricts the resolution of small objects.

To overcome this limitation multiple techniques like STED, STORM, PALM, TEM or others were developed, using advanced illumination and detection technologies.

In its original sense, the Abbe limit states, that the shorter the wavelength of the particle, the higher the resolution.

Therefore the observability to resolve small structural features in the image is also higher.

This fundamental law applies to visible light and to all photons of the electromagnetic spectrum.

That includes the high energy containing photons of extreme UV (XUV), roentgen radiation (Xray), and electrons.

While the diffraction limit is still valid, using XUV (CWL: 13.5nm), soft-Xray, and high energy containing electrons, it is possible to push the resolution higher.

Thus, enabling to resolve the fine structural features and dynamics in biological processes (cells, human body) as well as materials.

XIMEA’s solution

To fulfill these needs and leverage the high potential of XUV/soft-Xray, XIMEA added a new MJ042MR-GP-P11-BSI-UV model to the scientific portfolio of cameras.

The model is equipped with the new Gpixel GSENSE400BSI-UV (PulSar) sCMOS sensor that is combined with Peltier cooling and USB3 interface.

The camera body is extended by a standard DN 63 CF vacuum flange. Additional flange formats are available upon demand.

By using the new Pulsar sensor the spectral range is extended from IR, VIS, and UV into the soft-Xray regime, covering a maximum range from 0,5 to 1000 nm.

MJ042MR-GP-P11-BSI-UV camera model explode

Main specifications of the new MJ042 Pulsar models:

MJ042MR-GP-P11-BSI-UV	4.2 Mpix, Gpixel GSENSE400 BSI, backside illuminated monochrome, 2048 x 2048, 11 μm pixel, 2" with TEC and USB3
MJ042MR-GP-P6-BSI-UV	4.2 Mpix, Gpixel GSENSE2020 BSI, backside illuminated monochrome, 2048 x 2048, 6.5 μm pixel, 1.2" with TEC and USB3

Wavelength sensitivity ranges:

Soft X-ray	0.2 - 12 nm (0.1 – 5KeV)
XUV, EUV	10 - 124 nm (<0.1Kev @ cw:13.5nm)

spectrum_gsense400bsi_ps pulsar 80-1000nm camera ximea

Quantum efficiency graph for the GSENSE 400 BSI Pulsar sensor

Advantages:

Unique selling proposition:	Overall benefits:
Fast image acquisition and high framerates - 48 Fps Compact Simple USB interface Peltier cooling - Exceptional temperature stability (indium gaskets etc.) Custom sensor timings Modified sensor chamber, no outgassing, protected electronics	High Quantum efficiency up to 99% Dynamic range in HDR mode of above 95 dB Low noise around 1.7 e- High Full Well Capacity - up to 128K e- Improved axial-lateral resolution Vacuum compatibility (exposed sensor)

Applications

The wide pool of possible applications for this kind of detector ranges from Astronomy to nanotechnology throughout industrial and life science applications.

The industry demands new technologies to shrink the size of electronic components and increase their quality through coherent diffraction imaging techniques.

Science on the other hand requires this radiation to overcome the diffraction limit and resolve even smaller structural features.

For both, XIMEA developed a new camera operating with high sensitivity in Soft Xray spectroscopy and tomography.

Moreover, many chemical gases, as well as biological relevant molecules, have spectral signatures in the soft-Xray and UV regime.

Thus, these cameras are well suited to visualize and quantify mesoscale biology in the plane and 3D-image reconstruction and other applications like:

XANES	X-PEEM	STXM	EUV lithography	NEXAFS	UVRR
X-ray absorption near edge structure spectroscopy	X-ray photoemission electron microscopy	Scanning transmission x-ray microscopy	Semiconductor metrology	Near Edge X-ray Absorption fine structure	UV Resonance Raman spectroscopy
Hyperspectral	Forensic	Solar imaging	Correlative microscopy	Additive manufacturing	FIB/SEM: 3D imaging
Soft X-ray Water Window Tomography	Atmospheric chemistry/ composition	XUV ptychography and spectrometry	Electron detection imaging	Phase contrast imaging